Taipei • Taiwan | August 7—10, 2017
The IEEE Conference on Dependable and Secure Computing solicits papers, posters, practices, and experiences for presenting innovative research results, problem solutions, and new challenges in the field of dependable and secure computing. The whole spectrum of IT systems and application areas, including hardware design and software systems, with stringent relevant to dependability and security concerns are of interest to DSC. Authors are invited to submit original works on research and practice of creating, validating, deploying, and maintaining dependable and secure systems. The scope of DSC includes, but is not limited to, the following topics.
The DSC conference will also include a submission category for experience and practice papers on new findings in the two aforementioned categories. The PC will evaluate a submission to the experience and practice track with the understanding that it predominantly contributes to the VLSI/CAD design knowhow or the extension of the community’s knowledge about how the security protection of known techniques fares in real-world operations. Authors have to submit a short paper along with slides and an optional supplemental video to demonstrate the implementation and/or the practicability of the work. Topics of interest include, but are not limited to:
Papers should describe the original work with focus details. It should be no more than 8 pages for regular papers and 2 pages for experience and practice papers. Each submission will only be considered for one track - either the main conference track or the experience track, but not both. Papers must be written in English conforming to the IEEE standard conference format (US letter, two-column). All submitted papers will be peer-reviewed. Accepted papers will appear in the conference proceedings and will be included in the IEEE Xplore digital library. A subset of the papers will be invited to the IEEE Workshop on System Dependability and Security or poster sessions, and also considered for inclusion in the conference proceedings. Authors of selected papers will be invited to submit enhanced versions to IEEE Reliability magazine and journals.